Purpose of probe table:

　　The main purpose of the manual probe table is to provide a test platform for the electrical parameter test of the semiconductor chip. The probe table can absorb chips of various specifications, and provide multiple adjustable test pins and probe pedestal. With the measuring instrument, the voltage, current, resistance and capacitance voltage characteristic curve of the integrated circuit can be tested. It is suitable for scientific research analysis, spot check test and so on.

How to use the probe table:

　　1. Load the sample into the vacuum chuck and open the vacuum valve control switch, so that the sample can be safely and firmly adsorbed on the chuck.

　　2. Move the chuck platform with the control knob on the X /Y axis to see the sample clearly under the focus of the low-power objective lens of the microscope.

　　3. Switch the microscope to high magnification objective lens, find the spot to be measured under high magnification, fine-tune the microscope focus and sample x-y, and adjust the image clearly, with the measuring point at the center of the microscope field of view.

　　4. Specific position to confirm good, then adjust the position of the probe, the probe after installed eye view to probe will be moved to the next to close to the location of the specific, to use the probe more X - Y - Z three tuning knob, slowly remove the probe to be measuring point, actions need to be careful and slow at this time, to prevent excessive action of hitting chip, when the probe tip dangling in was over the station, can use first Y knob to move forward a little, a probe to use the Z axis knob to knit, finally use the X axis sliding around knob, observe whether there is a little scratch, prove whether have contact.

　　5. After the tip and the measured point are in good contact, the test can be started with the connected test equipment.